The substrates or their carriers are fed to the microtester via a width-adjustable conveyor. The PRS identifies the substrate and determines its exact position. Based on the determined offset values, the contacting is optimally positioned to the substrate, which permits precision contacting. The substrates in the carriers or multiple applications can be automatically stepped in X and Y direction and tested in a clamping. In combination with the Sirius-adapter technology, the MCent microtester can perform ICT and FCT for ≥ 200 µm test points.
The MCent microtester can be customised or further developed as required.