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Customised high current testers

High current tests of IGBTs, diodes or MOSFETs

MicroContact manufactures customised high-current testers for testing high-performance semiconductors such as diodes, IGBTs, SiCs or MOSFETs. The testers facilitate static and dynamic high-current testing directly on the BARE DIE, at DCB level or of entire modules.

In the high-current test adapter, the specific conditions are considered so that only the test subjects themselves are measured and an impact of the adapter with the connecting cables on the result is avoided.
Static high-current tester

The static high-current tester from MicroContact is a modular platform for testing applications in power electronics. Used for testing high-current DCB’s or modules, it reliably meets the requirements for quality assurance and a zero-defect strategy in production.

System description:

  • Static test cell
  • Contacting from the top
  • Fast change system for different DCB’s or modules

Static test:

  • Up to 3’000V, 3’000A
  • Pulse >100µs
  • Wide bandgap testing (Si, SiC, GaN)
  • MOSFET’s,
  • IGBT’s
  • RDS(ON)
  • VBRSS, IDSS,
  • IGSS
  • VGSTH
  • VSD

Statischer Hochstromtester MicroContact

Static DCB Tester

Static Hochstromtester MicroContact

Static Modul Tester

Dynamic high-current tester

The dynamic high-current tester from MicroContact is a testing application for power electronics. Used for testing high-current DCB’s or modules, it reliably meets the requirements for quality assurance and a zero-defect strategy in production.

System description:

  • Dynamic test cell
  • Contacting from the top
  • Test temperature 20°C to 180°C
  • Fast change system for different DCB’s or modules

Dynamic test:

  • Up to 1’500V, 10’000A, pulse >0.5µs
  • Multipulse test
  • Short circuit test
  • UIS (unclamped inductive switching)
  • CIS (clamped inductive switching)

Dynamischer Hochstromtester MicroContact

DCB Tester

Dynamischer Hochstromtester MicroContact

Modul Tester

Static & dynamic high-current tester

The module tester from MicroContact covers the complete high current test. After the first static test, the modules are heated to the required test temperature and will be tested dynamically. After a cooling phase, the modules are statically tested a second time and the test results are compared.

System description:

  • Static test
  • Heating up to ≤180°C
  • Dynamic test from top or from both side
  • Cooling down to <30°C
  • Second static test

Static test:

  • Up to 3’000V, 3’000A
  • Pulse >100µs
  • Wide Bandgap testing
    (Si, SiC, GaN)
  • MOSFET’s, IGBT’s
  • RDS(ON)
  • VBRSS, IDSS, IGSS
  • VGSTH
  • VSD

Dynamic test:

  • Up to 1’500V, 10’000A, pulse >0.5µs
  • Multipulse test
  • Short circuit test
  • UIS (unclamped inductive switching)
  • CIS (clamped inductive switching)

Statischer / Dynamischer Hochstromtester MicroContact

Modul Tester SDT

Statischer / Dynamischer Hochstromtester MicroContact

Modul Tester


Example applications

Test station for dynamic high current test

High current test IGBT

IGBT Tester

For measurement technology, we rely on our long-standing competent partner VX Instruments. Their reliable test systems, which are based on PXI and other technologies, ensure potential-free and accurate measurements. The high-current pulse-SMUs guarantee exceptionally short test times.

High-current test adapter

High current test system

High-current adapter

Your contact person

+41 62 285 80 13

Adrian Bangerter

Sales Manager & Management