MicroContact manufactures customised high-current testers for testing high-performance semiconductors such as diodes, IGBTs, SiCs or MOSFETs. The testers facilitate static and dynamic high-current testing directly on the BARE DIE, at DCB level or of entire modules.
The static high-current tester from MicroContact is a modular platform for testing applications in power electronics. Used for testing high-current DCB’s or modules, it reliably meets the requirements for quality assurance and a zero-defect strategy in production.
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System description:
Static test:
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The dynamic high-current tester from MicroContact is a testing application for power electronics. Used for testing high-current DCB’s or modules, it reliably meets the requirements for quality assurance and a zero-defect strategy in production.
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System description:
Dynamic test:
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The module tester from MicroContact covers the complete high current test. After the first static test, the modules are heated to the required test temperature and will be tested dynamically. After a cooling phase, the modules are statically tested a second time and the test results are compared.
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System description:
Static test:
Dynamic test:
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Example applications
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