MicroContact manufactures customised high-current testers for testing high-performance semiconductors such as diodes, IGBTs, SiCs or MOSFETs. The testers facilitate static and dynamic high-current testing directly on the BARE DIE, at DCB level or of entire modules.
In the high-current test adapter, the specific conditions are considered so that only the test subjects themselves are measured and an impact of the adapter with the connecting cables on the result is avoided.
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