Customised high current testers
MicroContact manufactures customised high-current testers for testing high-performance semiconductors such as diodes, IGBTs, SiCs or MOSFETs. The testers facilitate static and dynamic high-current testing directly on the BARE DIE, at DCB level or of entire modules.
For measurement technology, we rely on our long-standing competent partner VX Instruments. Their reliable test systems, which are based on PXI and other technologies, ensure potential-free and accurate measurements. The high-current pulse-SMUs guarantee exceptionally short test times.